国家/地区
关键词
出版物 APPLIED PHYSICS LET.（2）
出版时间 2013（2）
机构
作者 BOOSALIS A（2）

Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)

APPLIED PHYSICS LETTERS

DARAKCHIEVA V, BOOSALIS A, ZAKHAROV AA, HOFMANN T, SCHUBERT M, TIWALD TE, IAKIMOV T, VASILIAUSKAS R, YAKIMOVA R

Graphene as transparent electrode for direct observation of hole photoemission from silicon to oxide

APPLIED PHYSICS LETTERS

YAN RS, ZHANG Q, KIRILLOV OA, LI W, BASHAM J, BOOSALIS A, LIANG XL, JENA D, RICHTER CA, SEABAUGH AC, GUNDLACH DJ, XING HLG, NGUYEN NV