国家/地区 Netherlands（2）
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作者 CHEN XC（2）

Singularities and topologically protected states in twisted bilayer graphene

APPLIED PHYSICS LETTERS

YAO QR, CHEN XC, VAN BREMEN R, SOTTHEWES K, ZANDVLIET HJW

Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide

PHYSICAL REVIEW B

JONG TA, CHEN XC, JOBST J, KRASOVSKII EE, TROMP RM, MOLEN SJ