国家/地区
关键词
出版物
出版时间 2012（2）
机构
作者 CHUNG H（2）

Graphene Interconnect Lifetime: A Reliability Analysis

IEEE ELECTRON DEVICE LETTERS

CHEN XY, SEO DH, SEO S, CHUNG H, WONG HSP

Enhancement of quaternary nitrogen doping of graphene oxide via chemical reduction prior to thermal annealing and an investigation of its electrochemical properties

JOURNAL OF MATERIALS CHEMISTRY

HUAN TN, KHAI TV, KANG Y, SHIM KB, CHUNG H