国家/地区
关键词 STOCHASTIC FINITE ELEMENT MODEL（2）
出版物
出版时间
机构
作者 DE CURSI ES（2）

Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions

NANOMATERIALS

SHI JJ, CHU L, YU ZY, DE CURSI ES

The shear strain energy fluctuations caused by random porosities in graphene based on the stochastic finite element model

NEW JOURNAL OF PHYSICS

CHU L, SHI JJ, DE CURSI ES