国家/地区 Usa(6)
关键词 GRAPHENE(4) DEFECT(2) SCANNING TUNNELING .(2)
出版物 PHYSICAL REVIEW B(2)
出版时间 2013(6)
机构 CARNEGIE MEL.(3) OAK RIDGE NA.(2)
作者 FEENSTRA RM(6)

PHYSICAL REVIEW B

SRIVASTAVA N, GAO Q, WIDOM M, FEENSTRA RM, NIE S, MCCARTY KF, VLASSIOUK IV

IEEE TRANSACTIONS ON ELECTRON DEVICES

ZHAO P, FEENSTRA RM, GU G, JENA D

PHYSICAL REVIEW B

FEENSTRA RM, SRIVASTAVA N, GAO Q, WIDOM M, DIACONESCU B, OHTA T, KELLOGG GL, ROBINSON JT, VLASSIOUK IV