国家/地区 Poland（2）
关键词 KPFM（2）
出版物 MICROELECTRONIC ENGINEERING（2）
出版时间
机构
作者 GOTSZALK T（2）

High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

MICROELECTRONIC ENGINEERING

GAJEWSKI K, KUNICKI P, SIERAKOWSKI A, SZYMANSKI W, KACZOROWSKI W, NIEDZIELSKI P, RAMADAN S, SHAFOROST O, KLEIN N, HAO L, GOTSZALK T

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

MICROELECTRONIC ENGINEERING

GAJEWSKI K, SZYMANSKI W, NIEDZIELSKI P, GOTSZALK T