国家/地区 Switzerland（2）
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作者 GUINEA F（2）

Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

PHYSICAL REVIEW X

COUTO NJG, COSTANZO D, ENGELS S, KI DK, WATANABE K, TANIGUCHI T, STAMPFER C, GUINEA F, MORPURGO AF

Gauge fields and interferometry in folded graphene

PHYSICAL REVIEW B

RAINIS D, TADDEI F, POLINI M, LEON G, GUINEA F, FAL KO VI