| 国家/地区 | Italy(2) |
| 关键词 |
RAMAN SPECTROSCOPY(3)
|
| 出版物 | |
| 出版时间 | |
| 机构 | |
| 作者 |
IACOB E(3)
|
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
JOURNAL OF MICROSCOPY
DELL ANNA R, IACOB E, TRIPATHI M, DALTON A, BTTGER R, PEPPONI G
CARBON
PANTANO MF, IACOB E, PICCIOTTO A, MARGESIN B, CENTENO A, ZURUTUZA A, GALIOTIS C, PUGNO NM, SPERANZA G
SMALL
MESCOLA A, PAOLICELLI G, OGILVIE SP, GUARINO R, MCHUGH JG, ROTA A, IACOB E, GNECCO E, VALERI S, PUGNO NM, GADHAMSHETTY V, RAHMAN MM, AJAYAN P, DALTON AB, TRIPATHI M
