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STRAIN(2)
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| 机构 | |
| 作者 |
IACOB E(2)
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AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
JOURNAL OF MICROSCOPY
DELL ANNA R, IACOB E, TRIPATHI M, DALTON A, BTTGER R, PEPPONI G
SMALL
MESCOLA A, PAOLICELLI G, OGILVIE SP, GUARINO R, MCHUGH JG, ROTA A, IACOB E, GNECCO E, VALERI S, PUGNO NM, GADHAMSHETTY V, RAHMAN MM, AJAYAN P, DALTON AB, TRIPATHI M
