国家/地区 |
Italy(2)![]() |
关键词 | |
出版物 | |
出版时间 | |
机构 |
FDN BRUNO KESSLER(2)![]() |
作者 |
IACOB E(2)![]() |
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
JOURNAL OF MICROSCOPY
DELL ANNA R, IACOB E, TRIPATHI M, DALTON A, BTTGER R, PEPPONI G
LANGMUIR
BARTALI R, LAMBERTI A, BIANCO S, PIRRI CF, TRIPATHI M, GOTTARDI G, SPERANZA G, IACOB E, PUGNO N, LAIDANI N