BEILSTEIN JOURNAL OF NANOTECHNOLOGY

AKBARI E, ARORA VK, ENZEVAEE A, AHMADI MT, SAEIDMANESH M, KHALEDIAN M, KARIMI H, YUSOF R

MICROELECTRONICS RELIABILITY

GHADIRY M, NADI M, BAHADORAN M, MANAF AABD, KARIMI H, SADEGHI H

NANOSCALE RESEARCH LETTERS

KARIMI H, YUSOF R, RAHMANI R, HOSSEINPOUR H, AHMADI MT

JOURNAL OF NANOMATERIALS

AKBARI E, YUSOF R, AHMADI MT, ENZEVAEE A, KIANI MJ, KARIMI H, RAHMANI M

RSC ADVANCES

KARIMI H, AHMADI MT, KHOSROWABADI E, RAHMANI R, SAEIDIMANESH M, ISMAIL R, NAGHIB SD, AKBARI E

MICROELECTRONICS RELIABILITY

SAEIDMANESH M, RAHMANI M, KARIMI H, KHALEDIAN M, ISMAIL R

SEMICONDUCTOR SCIENCE TECHNOLOGY

SAEIDMANESH M, ISMAIL R, KHALEDIAN M, KARIMI H, AKBARI E

MICROELECTRONICS RELIABILITY

GHADIRY M, NADI M, BAHADORIAN M, MANAF AABD, KARIMI H, SADEGHI H

JOURNAL OF NANOMATERIALS

KARIMI H, YUSOF R, AHMADI MT, SAEIDMANESH M, RAHMANI M, AKBARI E, KIAT AK

JOURNAL OF NANOMATERIALS

SAEIDMANESH M, KIANI MJ, SIEW KE, AKBARI E, KARIMI H, ISMAIL R