SURFACE TOPOGRAPHYMETROLOGY PROPERTIES

WANG R, PEARCE R, GALLOP J, PATEL T, ZHAO F, POLLARD A, KLEIN N, JACKMAN R, ZURUTUZA A, HAO L

IET CIRCUITS DEVICES SYSTEMS

GONISZEWSKI S, GALLOP J, ADABI M, GAJEWSKI K, SHAFOROST O, KLEIN N, SIERAKOWSKI A, CHEN J, CHEN YF, GOTSZALK T, HAO L

2D MATERIALS

NOORI YJ, THOMAS S, RAMADAN S, GREENACRE VK, ABDELAZIM NM, HAN Y, ZHANG J, BEANLAND R, HECTOR AL, KLEIN N, REID G, BARTLETT PN, DE GROOT CH

ACS APPLIED ELECTRONIC MATERIALS

WANG YX, GUERENNEUR A, RAMADAN S, HUANG JL, FEARN S, NABI N, KLEIN N, ALFORD NM, PETROV PK

ACS APPLIED MATERIALS INTERFACES

RAMADAN S, LOBO R, ZHANG YZ, XU LZ, SHAFOROST O, TSANG DKH, FENG JY, YIN TY, QIAO M, RAJESHIRKE A, JIAO LR, PETROV PK, DUNLOP IE, TITIRICI MM, KLEIN N