国家/地区
关键词 SCANNING TUNNELING MICROSCOPY（2）
出版物
出版时间
机构
作者 KOEPKE JC（2）

Atomic-Scale Evidence for Potential Barriers and Strong Carrier Scattering at Graphene Grain Boundaries: A Scanning Tunneling Microscopy Study

ACS NANO

KOEPKE JC, WOOD JD, ESTRADA D, ONG ZY, HE KT, POP E, LYDING JW

Inducing Electronic Changes in Graphene through Silicon (100) Substrate Modification

NANO LETTERS

XU Y, HE KT, SCHMUCKER SW, GUO Z, KOEPKE JC, WOOD JD, LYDING JW, ALURU NR