国家/地区 China（4）
关键词
出版物 MICROELECTRONICS RE.（2）
出版时间 2017（2）
机构 CHINESE ACAD SCI（4）
作者 LI YD（4）

Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices

MICROELECTRONICS RELIABILITY

XI K, BI JS, XU YN, LI YD, ZHANG ZG, LIU M

The total ionizing dose effects of X-ray irradiation on graphene/Si Schottky diodes with a HfO2 insertion layer

MICROELECTRONICS RELIABILITY

XU YN, BI JS, LI YD, XI K, FAN LJ, LIU M, SANDIP M, LUO L

In Situ Observation of Thermal Proton Transport through Graphene Layers

ACS NANO

ZHU DM, LIU X, GAO Y, LI YD, WANG R, XU ZJ, JI GW, JIANG S, ZHAO B, YIN GZ, LI L, YANG TY, WANG Y, YI L, LI XL, TAI RZ

Transparent Ag@Au-graphene patterns with conductive stability via inkjet printing

JOURNAL OF MATERIALS CHEMISTRY C

LI LH, GAO M, GUO YZ, SUN JZ, LI YN, LI FY, SONG YL, LI YD