国家/地区
关键词
出版物 IEEE ELECTRON DEVICE LETTERS（2）
出版时间
机构
作者 LIU WJ（2）

Positive Bias-Induced V-th Instability in Graphene Field Effect Transistors

IEEE ELECTRON DEVICE LETTERS

LIU WJ, SUN XW, FANG Z, WANG ZR, TRAN XA, WANG F, WU L, NG GI, ZHANG JF, WEI J, ZHU HL, YU HY

Understanding Asymmetric Transportation Behavior in Graphene Field-Effect Transistors Using Scanning Kelvin Probe Microscopy

IEEE ELECTRON DEVICE LETTERS

LIU WJ, YU HY, XU SH, ZHANG Q, ZOU X, WANG JL, PEY KL, WEI J, ZHU HL, LI MF