国家/地区
关键词
出版物
出版时间 2016（2）
机构 SLOVAK ACAD SCI（2）
作者 SPITALSKY Z（2）

Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy

JOURNAL OF RAMAN SPECTROSCOPY

KOSTIUK D, BODIK M, SIFFALOVIC P, JERGEL M, HALAHOVETS Y, HODAS M, PELLETTA M, PELACH M, HULMAN M, SPITALSKY Z, OMASTOVA M, MAJKOVA E

Semi-transparent, conductive thin films of electrochemical exfoliated graphene

RSC ADVANCES

MARKOVIC ZM, BUDIMIR MD, KEPIC DP, HOLCLAJTNERANTUNOVIC ID, MARINOVICCINCOVIC MT, DRAMICANIN MD, SPASOJEVIC VD, PERUSKO DB, SPITALSKY Z, MICUSIK M, PAVLOVIC VB, TODOROVICMARKOVIC BM