国家/地区 Poland（3）
关键词 GRAPHENE（4） RAMAN SPECTROSCOPY（2） SECONDARY ION MASS .（2）
SIC（2）
出版物 NANOTECHNOLOGY（4）
出版时间 2018（2）
机构 INST ELECT M.（2）
作者 STRUPINSKI W（4）

Wafer-scale graphene quality assessment using micro four-point probe mapping

NANOTECHNOLOGY

MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH

Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of graphene

NANOTECHNOLOGY

MICHALOWSKI PP, PASTERNAK I, CIEPIELEWSKI P, GUINEA F, STRUPINSKI W

Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

NANOTECHNOLOGY

MICHALOWSKI PP, PASTERNAK I, STRUPINSKI W

In situ Raman spectroscopy of the graphene/water interface of a solution-gated field-effect transistor: electron-phonon coupling and spectroelectrochemistry

NANOTECHNOLOGY

BINDER J, URBAN JM, STEPNIEWSKI R, STRUPINSKI W, WYSMOLEK A