国家/地区 China（2）
关键词 DEFECT（2）
出版物
出版时间
机构
作者 SUI YP（2）

Crack-and-Fold Style Defects in CVD Graphene on Raw Cu Foils

JOURNAL OF ELECTRONIC MATERIALS

SUI YP, ZHANG YH, CHEN ZY, LIANG YJ, LI J, HU SK, KANG H, YU GH

Role of hydrogen and oxygen in the study of substrate surface impurities and defects in the chemical vapor deposition of graphene

CARBON

ZHANG YH, SUI YP, CHEN ZY, KANG H, LI J, WANG S, ZHAO SW, YU GH, PENG SG, JIN Z, LIU XY