国家/地区 China（2）
关键词
出版物
出版时间
机构 HUAZHONG UNIV SCI TECHNOL（2）
作者 WANG MF（2）

Wafer Scale Mapping and Statistical Analysis of Radio Frequency Characteristics in Highly Uniform CVD Graphene Transistors

ADVANCED ELECTRONIC MATERIALS

TIAN MC, HU B, YANG HF, TANG CC, WANG MF, GAO QG, XIONG X, ZHANG ZF, LI TY, LI XF, CU CZ, WU YQ

High-Performance CVD Bernal-Stacked Bilayer Graphene Transistors for Amplifying and Mixing Signals at High Frequencies

ACS APPLIED MATERIALS INTERFACES

TIAN MC, LI XF, LI TY, GAO QG, XIONG X, HU QL, WANG MF, WANG X, WU YQ