国家/地区 France（2）
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作者 WINKLER K（2）

Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000(1)over-bar) using photoelectron emission microscopy

ULTRAMICROSCOPY

BARRETT N, WINKLER K, KROMKER B, CONRAD EH

Dark field photoelectron emission microscopy of micron scale few layer graphene

REVIEW OF SCIENTIFIC INSTRUMENTS

BARRETT N, CONRAD E, WINKLER K, KROMKER B