国家/地区
关键词
出版物
出版时间 2011（2）
机构
作者 YU HY（2）

Understanding Asymmetric Transportation Behavior in Graphene Field-Effect Transistors Using Scanning Kelvin Probe Microscopy

IEEE ELECTRON DEVICE LETTERS

LIU WJ, YU HY, XU SH, ZHANG Q, ZOU X, WANG JL, PEY KL, WEI J, ZHU HL, LI MF

Impact of Process Induced Defects on the Contact Characteristics of Ti/Graphene Devices

ELECTROCHEMICAL SOLID STATE LETTERS

LIU WJ, YU HY, WEI J, LI MF