国家/地区
关键词 SCANNING TUNNELING MICROSCOPY（2）
出版物
出版时间
机构
作者 ZHOU XD（2）

Atomic-Scale Characterization of Graphene p-n Junctions for Electron-Optical Applications

ACS NANO

ZHOU XD, KERELSKY A, ELAHI MM, WANG D, HABIB KMM, SAJJAD RN, AGNIHOTRI P, LEE JU, GHOSH AW, ROSS FM, PASUPATHY AN

Electrical transport across grain boundaries in graphene monolayers on SiC(0 0 0 (1)over-bar)

2D MATERIALS

ZHOU XD, JI SH, CHOCKALINGAM SP, HANNON JB, TROMP RM, HEINZ TF, PASUPATHY AN, ROSS FM