国家/地区 China（3）
关键词 ATOMIC FORCE MICROSCOPY（3）
出版物
出版时间 2020（3）
机构
作者

Atomic-Scale Friction Characteristics of Graphene under Conductive AFM with Applied Voltages

ACS APPLIED MATERIALS INTERFACES

LANG HJ, PENG YT, CAO XA, ZOU K

Scanning Probe Microscopy of Topological Structure Induced Electronic States of Graphene

SMALL METHODS

LI SC, LIU MX, QIU XH

Measuring the specific surface area of monolayer graphene oxide in water

MATERIALS LETTERS

ZHANG SD, WANG HH, LIU JP, BAO CL