国家/地区 Usa（6）
关键词 ATOMIC FORCE MICROSCOPY（6）
出版物 ACS NANO（2）
出版时间 2010（6）
机构
作者

Empirical Study of Hall Bars on Few-Layer Graphene on C-Face 4H-SiC

JOURNAL OF ELECTRONIC MATERIALS

BOLEN ML, SHEN T, GU JJ, COLBY R, STACH EA, YE PD, CAPANO MA

Substrate effect on thickness-dependent friction on graphene

PHYSICA STATUS SOLIDI BBASIC SOLID STATE PHYSICS

LI QY, LEE C, CARPICK RW, HONE J

Mechanical Properties of Mono layer Graphene Oxide

ACS NANO

SUK JW, PINER RD, AN JH, RUOFF RS

Wafer-scale epitaxial graphene growth on the Si-face of hexagonal SiC (0001) for high frequency transistors

JOURNAL OF VACUUM SCIENCE TECHNOLOGY B

DIMITRAKOPOULOS C, LIN YM, GRILL A, FARMER DB, FREITAG M, SUN YN, HAN SJ, CHEN ZH, JENKINS KA, ZHU Y, LIU ZH, MCARDLE TJ, OTT JA, WISNIEFF R, AVOURIS P

Corrugation of Chemically Converted Graphene Monolayers on SiO2

ACS NANO

SINITSKII A, KOSYNKIN DV, DIMIEV A, TOUR JM

Identifying and characterizing epitaxial graphene domains on partially graphitized SiC(0001) surfaces using scanning probe microscopy

APPLIED PHYSICS LETTERS

KELLAR JA, ALABOSON JMP, WANG QH, HERSAM MC