国家/地区 | Italy(3) |
关键词 | ATOMIC FORCE MICROSCOPY(3) |
出版物 | |
出版时间 | 2020(3) |
机构 | |
作者 |
CARBON
SCHILIRO E, LO NIGRO R, PANASCI S, GELARDI FM, AGNELLO S, YAKIMOVA R, ROCCAFORTE F, GIANNAZZO F
APPLIED SCIENCESBASEL
TOMASELLA P, SANFILIPPO V, BONACCORSO C, CUCCI LM, CONSIGLIO G, NICOSIA A, MINEO PG, FORTE G, SATRIANO C
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
JOURNAL OF MICROSCOPY
DELL ANNA R, IACOB E, TRIPATHI M, DALTON A, BTTGER R, PEPPONI G