国家/地区 | Iran(4) |
关键词 | CIRCUIT MODELING(5) |
出版物 | IEEE JOURNAL OF QUA.(2) |
出版时间 | 2017(3) |
机构 | SHARIF UNIV .(2) |
作者 | KHAVASI A(2) |
IEEE JOURNAL OF QUANTUM ELECTRONICS
KHAVASI A, REJAEI B
MICROELECTRONICS RELIABILITY
FOTOOHI S, HAJINASIRI S
JOURNAL OF PHYSICS DAPPLIED PHYSICS
TAGHVAEE HR, ZARRINKHAT F, ABRISHAMIAN MS
IEEE JOURNAL OF QUANTUM ELECTRONICS
BAGHERI A, RAHMANI B, KHAVASI A