国家/地区 Iran(4)
关键词 CIRCUIT MODELING(5)
出版物 IEEE JOURNAL OF QUA.(2)
出版时间 2017(3)
机构 SHARIF UNIV .(2)
作者 KHAVASI A(2)

IEEE JOURNAL OF QUANTUM ELECTRONICS

KHAVASI A, REJAEI B

MICROELECTRONICS RELIABILITY

FOTOOHI S, HAJINASIRI S

JOURNAL OF PHYSICS DAPPLIED PHYSICS

TAGHVAEE HR, ZARRINKHAT F, ABRISHAMIAN MS

IEEE JOURNAL OF QUANTUM ELECTRONICS

BAGHERI A, RAHMANI B, KHAVASI A