国家/地区 | |
关键词 | CONDUCTIVE ATOMIC FORCE MICROSCOPY(3) |
出版物 | |
出版时间 | 2016(3) |
机构 | |
作者 |
NANO LETTERS
LEE WK, KANG JM, CHEN KS, ENGEL CJ, JUNG WB, RHEE D, HERSAM MC, ODOM TW
ADVANCED MATERIALS INTERFACES
CERMAK J, YAMADA T, GANZEROVA K, REZEK B
JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
SINGH B, MEHTA BR, VARANDANI D, SAVU AV, BRUGGER J