| 国家/地区 | |
| 关键词 |
CONDUCTIVE ATOMIC FORCE MICROSCOPY(4)
|
| 出版物 | |
| 出版时间 |
2021(4)
|
| 机构 | |
| 作者 |
NANOMATERIALS
LIM S, PARK H, YAMAMOTO G, LEE C, SUK JW
APPLIED SURFACE SCIENCE
MORIKUNI Y, DE SILVA KKH, VISWANATH P, HARA M, YOSHIMURA M
NANOTECHNOLOGY
GIANNAZZO F, DAGHER R, SCHILIRO E, PANASCI SE, GRECO G, NICOTRA G, ROCCAFORTE F, AGNELLO S, BRAULT J, CORDIER Y, MICHON A
SMALL
HUI F, LIU PS, HODGE SA, CAREY T, WEN C, TORRISI F, GALHENA DTL, TOMARCHIO F, LIN Y, MORENO E, ROLDAN JB, KOREN E, FERRARI AC, LANZA M
