国家/地区
关键词 CONDUCTIVE ATOMIC FORCE MICROSCOPY（2）
出版物 APPLIED SURFACE SCIENCE（2）
出版时间
机构
作者

Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy

APPLIED SURFACE SCIENCE

GIANNAZZO F, DERETZIS I, NICOTRA G, FISICHELLA G, SPINELLA C, ROCCAFORTE F, LA MAGNA A

Rapid and facile fabrication of conducting monolayer reduced graphene oxide films by methane plasma-assisted reduction

APPLIED SURFACE SCIENCE

MORIKUNI Y, DE SILVA KKH, VISWANATH P, HARA M, YOSHIMURA M