国家/地区 | Germany(2) Usa(2) |
关键词 | CONTACT RESISTANCE(8) |
出版物 | |
出版时间 | 2020(8) |
机构 | RHEIN WESTFA.(2) |
作者 |
GAHOI A(3)
KATARIA S(3)
LEMME MC(3)
DRIUSSI F(2)
VENICA S(2) |
SOLIDSTATE ELECTRONICS
PACHECOSANCHEZ A, FEIJOO PC, JIMENEZ D
IEEE ELECTRON DEVICE LETTERS
VAZIRI S, CHEN V, CAI LL, JIANG Y, CHEN ME, GRADY RW, ZHENG XL, POP E
MATERIALS LETTERS
BU XR, MA F, WU HY, WU Q, HAN CY, WANG XL, LI X, LIU WH
ADVANCED ELECTRONIC MATERIALS
GAHOI A, KATARIA S, DRIUSSI F, VENICA S, PANDEY H, ESSENI D, SELMI L, LEMME MC
ACS APPLIED MATERIALS INTERFACES
SOMAN A, BURKE RA, LI Q, VALENTIN MD, LI TT, MAO D, DUBEY M, GU TY
ACS APPLIED ELECTRONIC MATERIALS
WITTMANN S, AUMER F, WITTMANN D, PINDL S, WAGNER S, GAHOI A, REATO E, BELETE M, KATARIA S, LEMME MC
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
DRIUSSI F, VENICA S, GAHOI A, KATARIA S, LEMME MC, PALESTRI P
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
ASAD M, BONMANN M, YANG XX, VOROBIEV A, JEPPSON K, BANSZERUS L, OTTO M, STAMPFER C, NEUMAIER D, STAKE J