| 国家/地区 |
India(4)
|
| 关键词 |
DEFECT(4)
|
| 出版物 | |
| 出版时间 | 2018(2) |
| 机构 | ABV INDIAN I.(2) ATAL BIHARI .(2) |
| 作者 |
SRIVASTAVA A(4)
|
IEEE SENSORS JOURNAL
DANDELIYA S, SRIVASTAVA A
APPLIED NANOSCIENCE
SRIVASTAVA A, SANTHIBHUSHAN B
IEEE TRANSACTIONS ON NANOTECHNOLOGY
SANTHIBHUSHAN B, KHAN MS, BOHAT VK, SRIVASTAVA A
SUPERLATTICES MICROSTRUCTURES
TALUJA Y, SANTHIBHUSHAN B, YADAV S, SRIVASTAVA A
