国家/地区
关键词 DEFECT（3）
出版物 JOURNAL OF RAMAN SPECTROSCOPY（3）
出版时间 2018（3）
机构
作者

Reversibility of defect formation during oxygen-assisted electron-beam-induced etching of graphene

JOURNAL OF RAMAN SPECTROSCOPY

PILLET G, FREIRESOLER V, EROLES MN, BACSA W, DUJARDIN E, PUECH P

Raman study on the effects of annealing atmosphere of patterned graphene

JOURNAL OF RAMAN SPECTROSCOPY

SON J, CHOI M, HONG J, YANG IS

Tip-enhanced Raman scattering of graphene

JOURNAL OF RAMAN SPECTROSCOPY

BEAMS R