国家/地区
关键词 EFTEM（2）
出版物 ULTRAMICROSCOPY（2）
出版时间
机构
作者

The influence of inelastic scattering on EFTEM images-exemplified at 20 kV for graphene and silicon

ULTRAMICROSCOPY

LEE Z, ROSE H, HAMBACH R, WACHSMUTH P, KAISER U

Complementary microscopy techniques applied for optimizing the structure and performance of graphene-based hybrids

ULTRAMICROSCOPY

QIAN W, CHEN ZQ, EASTMAN M, COTTINGHAM S, MANHAT BA, GOFORTH AM, JIAO J