国家/地区 |
Usa(4)![]() |
关键词 |
FOCUSED ION BEAM(4)![]() |
出版物 | NANOTECHNOLOGY(2) |
出版时间 | 2017(2) |
机构 | |
作者 |
NANOTECHNOLOGY
ZHANG Y, HUI C, SUN RJ, LI K, HE K, MA XC, LIU F
MEASUREMENT SCIENCE TECHNOLOGY
LEI N, LI PF, XUE W, XU J
2D MATERIALS
MILLER D, ALEMAN B
NANOTECHNOLOGY
BOUTILIER MSH, HADJICONSTANTINOU NG, KARNIK R