| 国家/地区 |
Usa(4)
|
| 关键词 |
FOCUSED ION BEAM(4)
|
| 出版物 | NANOTECHNOLOGY(2) |
| 出版时间 | 2017(2) |
| 机构 | |
| 作者 |
NANOTECHNOLOGY
ZHANG Y, HUI C, SUN RJ, LI K, HE K, MA XC, LIU F
MEASUREMENT SCIENCE TECHNOLOGY
LEI N, LI PF, XUE W, XU J
2D MATERIALS
MILLER D, ALEMAN B
NANOTECHNOLOGY
BOUTILIER MSH, HADJICONSTANTINOU NG, KARNIK R
