| 国家/地区 | |
| 关键词 |
FOCUSED ION BEAM(3)
|
| 出版物 | |
| 出版时间 |
2011(3)
|
| 机构 | |
| 作者 |
MEASUREMENT SCIENCE TECHNOLOGY
LEI N, LI PF, XUE W, XU J
JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
VENUGOPAL G, KIM SJ
JOURNAL OF NANOELECTRONICS OPTOELECTRONICS
BLOM T, JAFRI SHM, WIDENKVIST E, JANSSON U, GRENNBERG H, QUINLAN RA, HOLLOWAY BC, LEIFER K
