国家/地区 | |
关键词 | FOCUSED ION BEAM(3) |
出版物 | |
出版时间 | 2011(3) |
机构 | |
作者 |
MEASUREMENT SCIENCE TECHNOLOGY
LEI N, LI PF, XUE W, XU J
JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
VENUGOPAL G, KIM SJ
JOURNAL OF NANOELECTRONICS OPTOELECTRONICS
BLOM T, JAFRI SHM, WIDENKVIST E, JANSSON U, GRENNBERG H, QUINLAN RA, HOLLOWAY BC, LEIFER K