国家/地区
关键词 FOCUSED ION BEAM（3）
出版物
出版时间 2020（3）
机构
作者

Nanoscale profiling of multilayer graphene films on silicon carbide by a focused ion beam

DIAMOND RELATED MATERIALS

KOLOMIYTSEV AS, JITYAEV IL, SVETLICHNYI AM, FEDOTOV AA, AGEEV OA

Investigating electrical properties of controllable graphene nanoribbon field effect transistors

PHYSICA BCONDENSED MATTER

WANG JP, WANG Q

Fabrication of Si Micropore and Graphene Nanohole Structures by Focused Ion Beam

SENSORS

IBRAHIM NNNM, HASHIM AM