国家/地区 | China(2) Taiwan(2) |
关键词 | HYSTERESIS EFFECT(4) |
出版物 | ACS APPLIED MATERIA.(2) |
出版时间 | 2023(2) |
机构 | |
作者 |
CHU CM(2)
LIN CH(2)
LIN CT(2)
LIN CY(2)
LU YX(2) TSAI MH(2) WANG CC(2) WOON WY(2) |
MICROELECTRONICS RELIABILITY
ZHANG QW, LI P, LIAO YB, WANG G, ZENG RZ, WANG H
SMALL
XU H, CHEN YB, ZHANG J, ZHANG HL
ACS APPLIED MATERIALS INTERFACES
TSAI MH, LU YX, LIN CY, LIN CH, WANG CC, CHU CM, WOON WY, LIN CT
ACS APPLIED MATERIALS INTERFACES
TSAI MH, LU YX, LIN CY, LIN CH, WANG CC, CHU CM, WOON WY, LIN CT