国家/地区 Iran（2）
关键词 INTERCONNECT（3）
出版物 MICROELECTRONICS RELIABILITY（3）
出版时间
机构 ISLAMIC AZAD.（2）
作者 HAJINASIRI S（2）

Transfer matrix model of multilayer graphene nanoribbon interconnects

MICROELECTRONICS RELIABILITY

FOTOOHI S, HAJINASIRI S

Modeling and analysis of crosstalk induced overshoot/undershoot effects in multilayer graphene nanoribbon interconnects and its impact on gate oxide reliability

MICROELECTRONICS RELIABILITY

SAHOO M, RAHAMAN H

Crosstalk bandwidth and stability analysis in graphene nanoribbon interconnects

MICROELECTRONICS RELIABILITY

BAGHERI A, RANJBAR M, HAJINASIRI S, MIRZAKUCHAKI S