国家/地区 Korea（2）
关键词 OPTICAL MICROSCOPY（2）
出版物
出版时间
机构
作者

Nondestructive Characterization of Graphene Defects

ADVANCED FUNCTIONAL MATERIALS

LY TH, DUONG DL, TA QH, YAO F, VU QA, JEONG HY, CHAE SH, LEE YH

Contrast enhancement for quantitative image analysis of graphene oxide using optical microscopy for Si-based field effect transistors

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

LEE W, OH Y, LEE KE, LEE JU