国家/地区 Usa(5) Singapore(2)
关键词 SCALING(11)
出版物 IEEE ELECTRON DEVIC.(3) NANO LETTERS(3)
出版时间 2011(3) 2013(2)
机构 PURDUE UNIV(2) UNIV ILLINOI.(2)
作者 BAE MH(2) DORGAN VE(2) ISLAM S(2) LOW T(2)
LUNDSTROM M(2) POP E(2)

IEEE ELECTRON DEVICE LETTERS

BONMANN M, ASAD M, YANG XX, GENERALOV A, VOROBIEV A, BANSZERUS L, STAMPFER C, OTTO M, NEUMAIER D, STAKE J

IEEE ELECTRON DEVICE LETTERS

CONTINO A, CIOFI I, WU XY, ASSELBERGHS I, CELANO U, WILSON CJ, TOKEI Z, GROESENEKEN G, SOREE B

NANO LETTERS

CHENG ZG, HOU JF, ZHOU QY, LI TY, LI HB, YANG L, JIANG KL, WANG C, LI YC, FANG Y

IEEE ELECTRON DEVICE LETTERS

ISLAM S, LI ZY, DORGAN VE, BAE MH, POP E

NANO LETTERS

GRASSI R, LOW T, LUNDSTROM M

NANO LETTERS

SUI Y, LOW T, LUNDSTROM M, APPENZELLER J