国家/地区 Switzerland(5) China(2)
关键词 SCANNING TUNNELING MICROSCOPY(7)
出版物 ACS NANO(2)
出版时间 2018(2)
机构 EMPA SWISS F.(3)
作者 FENG XL(7)

ACS APPLIED NANO MATERIALS

BARIN GB, FAIRBROTHER A, ROTACH L, BAYLE M, PAILLET M, LIANG LB, MEUNIER V, HAUERT R, DUMSLAFF T, NARITA A, MULLEN K, SAHABUDEEN H, BERGER R, FENG XL, FASEL R, RUFFIEUX P

ACS NANO

MISHRA S, LOHR TG, PIGNEDOLI CA, LIU JZ, BERGER R, URGEL JI, MULLEN K, FENG XL, RUFFIEUX P, FASEL R

ACS NANO

DI GIOVANNANTONIO M, DENIZ O, URGEL JI, WIDMER R, DIENEL T, STOLZ S, SANCHEZSANCHEZ C, MUNTWILER M, DUMSLAFF T, BERGER R, NARITA A, FENG XL, MULLEN K, RUFFIEUX P, FASEL R

NANO RESEARCH

ZHANG YF, ZHANG Y, LI G, LU JC, QUE YD, CHEN H, BERGER R, FENG XL, MULLEN K, LIN X, ZHANG YY, DU SX, PANTELIDES ST, GAO HJ

NANO LETTERS

DIENEL T, KAWAI S, SODE H, FENG XL, MULLEN K, RUFFIEUX P, FASEL R, GRONING O

SMALL

BARIN GB, SUN Q, DI GIOVANNANTONIO M, DU CZ, WANG XY, LLINAS JP, MUTLU Z, LIN YX, WILHELM J, OVERBECK J, DANIELS C, LAMPARSKI M, SAHABUDEEN H, PERRIN ML, URGEL JI, MISHRA S, KINIKAR A, WIDMER R, STOLZ S, BOMMERT M, PIGNEDOLI C, FENG XL, CALAME M, MULLEN K, NARITA A, MEUNIER V, BOKOR J, FASEL R, RUFFIEUX P

CHINESE PHYSICS B

YANG H, GAO YX, NIU WH, CHANG X, HUANG L, LIU JZ, MAI YY, FENG XL, DU SX, GAO HJ