国家/地区 France(6)
关键词 SCANNING TUNNELLING MICROSCOPY(6)
出版物 APPLIED PHYSICS LET.(3) BEILSTEIN JOURNAL O.(2)
出版时间 2010(2)
机构 CNRS(2)
作者 CHARRA F(2)

APPLIED PHYSICS LETTERS

VOVAN C, SCHUMACHER S, CORAUX J, SESSI V, FRUCHART O, BROOKES NB, OHRESSER P, MICHELY T

APPLIED PHYSICS LETTERS

OUERGHI A, KAHOULI A, LUCOT D, PORTAIL M, TRAVERS L, GIERAK J, PENUELAS J, JEGOU P, SHUKLA A, CHASSAGNE T, ZIELINSKI M

APPLIED PHYSICS LETTERS

AUFRAY B, KARA A, VIZZINI S, OUGHADDOU H, LEANDRI C, EALET B, LE LAY G

BEILSTEIN JOURNAL OF NANOTECHNOLOGY

SGHAIER T, LE LIEPVRE S, FIORINI C, DOUILLARD L, CHARRA F

BEILSTEIN JOURNAL OF NANOTECHNOLOGY

DU P, BLEGER D, CHARRA F, BOUCHIAT V, KREHER D, MATHEVET F, ATTIAS AJ