国家/地区 | France(6) |
关键词 | SCANNING TUNNELLING MICROSCOPY(6) |
出版物 | APPLIED PHYSICS LET.(3) BEILSTEIN JOURNAL O.(2) |
出版时间 | 2010(2) |
机构 | CNRS(2) |
作者 | CHARRA F(2) |
APPLIED PHYSICS LETTERS
VOVAN C, SCHUMACHER S, CORAUX J, SESSI V, FRUCHART O, BROOKES NB, OHRESSER P, MICHELY T
APPLIED PHYSICS LETTERS
OUERGHI A, KAHOULI A, LUCOT D, PORTAIL M, TRAVERS L, GIERAK J, PENUELAS J, JEGOU P, SHUKLA A, CHASSAGNE T, ZIELINSKI M
APPLIED PHYSICS LETTERS
AUFRAY B, KARA A, VIZZINI S, OUGHADDOU H, LEANDRI C, EALET B, LE LAY G
PHYSICAL REVIEW B
HIEBEL F, MALLET P, MAGAUD L, VEUILLEN JY
BEILSTEIN JOURNAL OF NANOTECHNOLOGY
SGHAIER T, LE LIEPVRE S, FIORINI C, DOUILLARD L, CHARRA F
BEILSTEIN JOURNAL OF NANOTECHNOLOGY
DU P, BLEGER D, CHARRA F, BOUCHIAT V, KREHER D, MATHEVET F, ATTIAS AJ