国家/地区 England（3） Poland（3）
关键词 SECONDARY ION MASS SPECTROMETRY（6）
出版物 NANOTECHNOLOGY（2）
出版时间 2018（2）
机构 INST ELECT M.（2） NATL PHYS LA.（2）
作者 MICHALOWSKI .（3） PASTERNAK I（3） POLLARD AJ（3） STRUPINSKI W（3）
BRENNAN B（2）

Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of graphene

NANOTECHNOLOGY

MICHALOWSKI PP, PASTERNAK I, CIEPIELEWSKI P, GUINEA F, STRUPINSKI W

Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

NANOTECHNOLOGY

MICHALOWSKI PP, PASTERNAK I, STRUPINSKI W

Structural, chemical and electrical characterisation of conductive graphene-polymer composite films

APPLIED SURFACE SCIENCE

BRENNAN B, SPENCER SJ, BELSEY NA, FARIS T, CRONIN H, SILVA SRP, SAINSBURY T, GILMORE IS, STOEVA Z, POLLARD AJ

Metrology for graphene and 2D materials

MEASUREMENT SCIENCE TECHNOLOGY

POLLARD AJ

Precise localization of contaminants in graphene with secondary ion mass spectrometry

MEASUREMENT

MICHALOWSKI PP, KOZDRA S, PASTERNAK I, SITEK J, WOJCIK A, STRUPINSKI W

Gas Cluster Ion Beam Cleaning of CVD-Grown Graphene for Use in Electronic Device Fabrication

ACS APPLIED NANO MATERIALS

BRENNAN B, CENTENO A, ZURUTUZA A, MACK P, PATON KR, POLLARD AJ