国家/地区 | |
关键词 |
SPECTROSCOPIC ELLIPSOMETRY(2)![]() |
出版物 | |
出版时间 |
2019(2)![]() |
机构 | |
作者 |
JOURNAL OF OPTOELECTRONICS ADVANCED MATERIALS
BASCHIR L, SAVASTRU D, POPESCU AA, VASILIU IC, FILIPESCU M, IORDACHE AM, ELISA M, IORDACHE SM, BUIU O, OBREJA C
APPLIED SURFACE SCIENCE
CASTRIOTA M, POLITANO GG, VENA C, DE SANTO MP, DESIDERIO G, DAVOLI M, CAZZANELLI E, VERSACE C