国家/地区
关键词 TERAHERTZ SPECTROSCOPY（2）
出版物 NANOTECHNOLOGY（2）
出版时间
机构
作者

Wafer-scale graphene quality assessment using micro four-point probe mapping

NANOTECHNOLOGY

MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH

Terahertz time-domain spectroscopy as a novel metrology tool for liquid-phase exfoliated few-layer graphene

NANOTECHNOLOGY

SKALSKY S, MOLLOY J, NAFTALY M, SAINSBURY T, PATON KR