国家/地区 China（2）
关键词
出版物 ADVANCED ELECTRONIC MATERIALS（2）
出版时间
机构
作者 HU B（2）

Wafer Scale Mapping and Statistical Analysis of Radio Frequency Characteristics in Highly Uniform CVD Graphene Transistors

ADVANCED ELECTRONIC MATERIALS

TIAN MC, HU B, YANG HF, TANG CC, WANG MF, GAO QG, XIONG X, ZHANG ZF, LI TY, LI XF, CU CZ, WU YQ

Controllable Multiple Depression in a Graphene Oxide Artificial Synapse

ADVANCED ELECTRONIC MATERIALS

WANG LY, WANG ZY, ZHAO W, HU B, XIE LH, YI MD, LING HF, ZHANG CX, CHEN Y, LIN JY, ZHU JL, HUANG W