国家/地区 France(50)
关键词 GRAPHENE(10) ELECTRONIC PROPERTI.(4) EPITAXIAL GRAPHENE(4)
SPECTROSCOPY(4) LOWENERGY ELECTRON .(3) BAND ALIGNMENT(2)
BAND STRUCTURE(2) FIB(2) HETEROSTRUCTURE(2)
RAMAN SPECTROSCOPY(2) VAN DER WAALS MATER.(2) XRAY PHOTOELECTRON .(2)
出版物 APPLIED PHYSICS LET.(11) PHYSICAL REVIEW B(9) SCIENTIFIC REPORTS(8)
ACS NANO(5) CARBON(3) MICROELECTRONIC ENG.(3)
NANO RESEARCH(2) NANOSCALE(2) SURFACE SCIENCE(2)
出版时间 2016(9) 2012(8) 2014(7) 2010(4) 2013(4) 2015(4) 2018(4) 2009(2) 2011(2) 2017(2) 2019(2)
机构 CNRS(21) UNIV PARIS S.(12) UNIV PARIS 0.(5) LPN CNRS(2)
作者 OUERGHI A(50)

ACS NANO

NOUMBE UN, GREBOVAL C, LIVACHE C, CHU A, MAJJAD H, LOPEZ LEP, MOUAFO LDN, DOUDIN B, BERCIAUD S, CHASTE J, OUERGHI A, LHUILLIER E, DAYEN JF

CARBON

ZRIBI B, HAGHIRIGOSNET AM, BENDOUNAN A, OUERGHI A, KORRIYOUSSOUFI H

PHYSICAL REVIEW B

WAKAMURA T, REALE F, PALCZYNSKI P, ZHAO MQ, JOHNSON ATC, GUERON S, MATTEVI C, OUERGHI A, BOUCHIAT H

PHYSICAL REVIEW B

HENCK H, AVILA J, BEN AZIZA Z, PIERUCCI D, BAIMA J, PAMUK B, CHASTE J, UTT D, BARTOS M, NOGAJEWSKI K, PIOT BA, ORLITA M, POTEMSKI M, CALANDRA M, ASENSIO MC, MAURI F, FAUGERAS C, OUERGHI A

PHYSICAL REVIEW B

HENCK H, BEN AZIZA Z, PIERUCCI D, LAOURINE F, REALE F, PALCZYNSKI P, CHASTE J, SILLY MG, BERTRAN F, LE FEVRE P, LHUILLIER E, WAKAMURA T, MATTEVI C, RAULT JE, CALANDRA M, OUERGHI A

ELECTRONIC MATERIALS LETTERS

MELE D, MEHDHBI S, FADIL D, WEI W, OUERGHI A, LEPILLIET S, HAPPY H, PALLECCHI E

NANOSCALE

SERRANO G, VELEZFORT E, CIMATTI I, CORTIGIANI B, MALAVOLTI L, BETTO D, OUERGHI A, BROOKES NB, MANNINI M, SESSOLI R

APPLIED PHYSICS LETTERS

BOUTCHICH M, AREZKI H, ALAMARGUY D, HO KI, SEDIRI H, GUNES F, ALVAREZ J, KLEIDER JP, LAI CS, OUERGHI A

PHYSICAL REVIEW B

MAERO S, TORCHE A, PHUPHACHONG T, PALLECCHI E, OUERGHI A, FERREIRA R, DE VAULCHIER LA, GULDNER Y

JOURNAL OF PHYSICAL CHEMISTRY C

DENG CX, LIN WW, AGNUS G, DRAGOE D, PIERUCCI D, OUERGHI A, EIMER S, BARISIC I, RAVELOSONA D, CHAPPERT C, ZHAO WS