国家/地区 |
Italy(3)![]() |
关键词 |
CONDUCTIVE ATOMIC FORCE MICROSCOPY(3)![]() |
出版物 | |
出版时间 |
2019(3)![]() |
机构 | CNR(2) |
作者 | GIANNAZZO F(2) SCHILIRO E(2) |
ACS APPLIED ELECTRONIC MATERIALS
GIANNAZZO F, GRECO G, SCHILIRO E, LO NIGRO R, DERETZIS I, LA MAGNA A, ROCCAFORTE F, IUCOLANO F, RAVESI S, FRAYSSINET E, MICHON A, CORDIER Y
ACS APPLIED MATERIALS INTERFACES
PEA M, DE SETA M, DI GASPARE L, PERSICHETTI L, SCAPARRO AM, MISEIKIS V, COLETTI C, NOTARGIACOMO A
NANOTECHNOLOGY
GIANNAZZO F, SHTEPLIUK I, IVANOV G, IAKIMOV T, KAKANAKOVAGEORGIEVA A, SCHILIRO E, FIORENZA P, YAKIMOVA R