国家/地区 Spain（2）
关键词 LOGIC GATE（2）
出版物
出版时间
机构
作者 WEI W（2）

Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, WEI W, PALLECCHI E, HAPPY H, JIMENEZ D

Bias-Dependent Intrinsic RF Thermal Noise Modeling and Characterization of Single-Layer Graphene FETs

IEEE TRANSACTIONS ON MICROWAVE THEORY TECHNIQUES

MAVREDAKI N, PACHECOSANCHEZ A, SAKALAS P, WEI W, PALLECCHR E, HAPPY H, JIMENEZ D