国家/地区 Usa（2）
关键词 DEFECT（2）
出版物
出版时间 2013（2）
机构 OAK RIDGE NA.（2）
作者 FEENSTRA RM（2）

Spatially Resolved Mapping of Electrical Conductivity across Individual Domain (Grain) Boundaries in Graphene

ACS NANO

CLARK KW, ZHANG XG, VLASSIOUK IV, HE GW, FEENSTRA RM, LI AP

Atomic-Scale Mapping of Thermoelectric Power on Graphene: Role of Defects and Boundaries

NANO LETTERS

PARK J, HE GW, FEENSTRA RM, LI AP